{"id":79,"date":"2019-11-14T23:44:54","date_gmt":"2019-11-14T23:44:54","guid":{"rendered":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/?page_id=79"},"modified":"2026-02-09T21:35:08","modified_gmt":"2026-02-09T21:35:08","slug":"publications-2","status":"publish","type":"page","link":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/publications-2\/","title":{"rendered":"Publications"},"content":{"rendered":"<div class=\"fsn-row full-width-row fsn-6a4f00ae8f7ba light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae8f83f light\"><div class=\"fsn-image fsn-6a4f00ae8fb58 align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2026\/02\/acs-300x86.jpg\" width=\"300\" height=\"86\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae8fb83 light\"><div class=\"fsn-text fsn-6a4f00ae8fbd4\">\n<p><span style=\"color: #000000;\">Analytical Chemistry <\/span><br \/>\n<span style=\"color: #000000;\">2020 92 (23), 15454-15462<\/span><br \/>\n<span style=\"color: #000000;\">DOI: 10.1021\/acs.analchem.0c03126<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae8fbfb light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae8fc80 light\"><div class=\"fsn-text fsn-6a4f00ae8fcc8\">\n<p><a href=\"https:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/acs.analchem.0c03126?ref=article_openPDF\"><span style=\"color: #000000;\">Vincent Moxley-Paquette, Daniel Lane, Ronald Soong, Paris Ning, Monica Bastawrous, Bing Wu, Maysam Zamani Pedram, <strong>Md Aminul Haque Talukder<\/strong>, Ebrahim Ghafar-Zadeh et. al., <strong>&#8220;5-axis CNC Micro-milling for Rapid, Cheap and Background Free NMR Micro-coils&#8221;<\/strong><\/span><\/a><\/p>\n<\/div><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-divider fsn-6a4f00ae8fcdb\"><hr><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae8fcfb light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae8fd24 light\"><div class=\"fsn-image fsn-6a4f00ae8ff56 align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/ccece_logo-300x67.gif\" width=\"300\" height=\"67\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae8ff77 light\"><div class=\"fsn-text fsn-6a4f00ae8ff90\">\n<p><span style=\"color: #000000;\">CCECE 2012: 25th Canadian Conference on Electrical and Computer Engineering<\/span><br \/>\n<span style=\"color: #000000;\">29 Apr 2012 &#8211; 02 May 2012<\/span><br \/>\n<span style=\"color: #000000;\">Montreal, Quebec<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae8ffae light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae8ffd6 light\"><div class=\"fsn-text fsn-6a4f00ae8ffea\">\n<p><a href=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/1.-CCECE-2012-PAPER-CONCORDIA.pdf\"><span style=\"color: #000000;\"><strong>Talukder, Md. A.H.<\/strong>; Raut, R., \u201cCMOS Amplifier Module Allowing for Voltage, Current, Transimpedance and Transadmittance Transfer Functions Implementations\u201d, 2012 <em>IEEE 25<sup>th<\/sup> Canadian Conference on Electrical and Computer Engineering (CCECE)<\/em>, Montreal, QC, pp. 1-4, April 29-May 02, 2012<\/span><\/a><\/p>\n<\/div><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-divider fsn-6a4f00ae8fff4\"><hr><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae9000e light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae90057 light\"><div class=\"fsn-image fsn-6a4f00ae9025f align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/ICECS-300x118.jpg\" width=\"300\" height=\"118\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae9027d light\"><div class=\"fsn-text fsn-6a4f00ae90295\">\n<p><span style=\"color: #000000;\">ICECS 2011: The International Conference on Electronics, Circuits and Systems<\/span><br \/>\n<span style=\"color: #000000;\">11 Dec 2011 &#8211; 14 Dec 2011<\/span><br \/>\n<span style=\"color: #000000;\">Beirut, Lebanon<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae902b0 light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae902d5 light\"><div class=\"fsn-text fsn-6a4f00ae902e7\">\n<p><a href=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/2.-ICECS-2011-PAPER-CONCORDIA.pdf\"><span style=\"color: #000000;\">Raut, R.; <strong>Talukder, Md. A.H.<\/strong>, \u201cEstimating the Design Value(s) Of the Shunt-Peaking Inductor(s) in CMOS Trans-Impedance Amplifier System by Placement of Poles and Zeros\u201d, 2011 <em>IEEE 18<sup>th<\/sup> International Conference on Electronics, Circuits and Systems (ICECS)<\/em>, Beirut, pp. 17-20, December 11 \u2013 14, 2011<\/span><\/a><\/p>\n<\/div><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-divider fsn-6a4f00ae902f2\"><hr><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae9030a light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae90329 light\"><div class=\"fsn-image fsn-6a4f00ae90536 align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/Untitled-300x91.png\" width=\"300\" height=\"91\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae90554 light\"><div class=\"fsn-text fsn-6a4f00ae9056b\">\n<p><span style=\"color: #000000;\">SPI 2014: IEEE Workshop on Signal and Power Integrity<\/span><br \/>\n<span style=\"color: #000000;\">11 May 2013 &#8211; 14 May 2014<\/span><br \/>\n<span style=\"color: #000000;\">Ghent, Belgium<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae90585 light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae905aa light\"><div class=\"fsn-text fsn-6a4f00ae905bc\">\n<p><a href=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/3.-SPI-2014-PAPER-MCGILL.pdf\"><span style=\"color: #000000;\"><strong>Talukder, Md. A.H.<\/strong>; Kabir, Muhammad; Roy, Sourajeet; Khazaka, Roni; \u201cEfficient Generation of Macromodels via the Loewner Matrix Approach for the Stochastic Analysis of High-Speed Passive Distributed Networks\u201d, <em>IEEE 18<sup>th<\/sup> Workshop on Signal and Power Integrity (SPI)<\/em>, Ghent, pp. 1-4, May 11-14, 2014<\/span><\/a><\/p>\n<\/div><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-divider fsn-6a4f00ae905c6\"><hr><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae905e0 light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae90600 light\"><div class=\"fsn-image fsn-6a4f00ae90805 align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/SIPI2-300x118.jpg\" width=\"300\" height=\"118\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae90826 light\"><div class=\"fsn-text fsn-6a4f00ae9083d\">\n<p><span style=\"color: #000000;\">SIPI 2014: IEEE International Symposium on Electromagnetic Compatibility<\/span><br \/>\n<span style=\"color: #000000;\">04 Aug 2014 &#8211; 08 Aug 2014<\/span><br \/>\n<span style=\"color: #000000;\">Raleigh, North Carolina, USA<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae9085b light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae9087f light\"><div class=\"fsn-text fsn-6a4f00ae90890\">\n<p><a href=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/4.-SIPI-2014-PAPER-MCGILL.pdf\"><span style=\"color: #000000;\"><strong>Talukder, Md. A.H.<\/strong>; Kabir, Muhammad; Roy, Sourajeet; Khazaka, Roni; \u201cEfficient Stochastic Transient Analysis of High-Speed Passive Distributed Networks using Loewner Matrix based Macromodels\u201d, <em>IEEE\u00a0 International Conference on Signal and Power Integrity (SIPI)<\/em>, Raleigh, North Carolina (USA), August 4\u20138, 2014<\/span><\/a><\/p>\n<\/div><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-divider fsn-6a4f00ae9089b\"><hr><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae908b2 light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-7\"><div class=\"fsn-column-inner fsn-6a4f00ae908d0 light\"><div class=\"fsn-image fsn-6a4f00ae90ab5 align-none\"><img src=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/EPEPS2014-Banner-300x149.png\" width=\"300\" height=\"149\" alt=\"\" class=\"img-responsive img-default\" loading=\"lazy\"><\/div><\/div><\/div><div class=\"col-sm-5\"><div class=\"fsn-column-inner fsn-6a4f00ae90adb light\"><div class=\"fsn-text fsn-6a4f00ae90af1\">\n<p><span style=\"color: #000000;\">EPEPS 2014: 23rd Conference on Electrical Performance of Electronic Packaging and Systems<\/span><br \/>\n<span style=\"color: #000000;\">26 Oct 2014 &#8211; 29 Oct 2014<\/span><br \/>\n<span style=\"color: #000000;\">Portland, Oregon, USA<\/span><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fsn-row full-width-row fsn-6a4f00ae90b0a light\" style=\"background-repeat:repeat;background-position:left top;background-attachment:scroll;background-size:auto;\"><div class=\"container-fluid\"><div class=\"row\"><div class=\"col-sm-12\"><div class=\"fsn-column-inner fsn-6a4f00ae90b6f light\"><div class=\"fsn-text fsn-6a4f00ae90b86\">\n<p><a href=\"https:\/\/www.eecs.yorku.ca\/~mdaminul\/wp-content\/uploads\/2019\/11\/5.-EPEPS-2014-PAPER-MCGILL.pdf\"><span style=\"color: #000000;\">Dolatsara, Majid A.; Kabir, Muhammad; <strong>Talukder, Md. A.H.<\/strong>; et al.; \u201cNon-Intrusive Pseudo Spectral Approach for Stochastic Macromodeling of EM Systems using Deterministic Full-wave Solvers\u201d, 2014 <em>IEEE 23<sup>rd<\/sup> Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), Portland, Oregon (USA), <\/em>October 26\u201329, 2014<\/span><\/a><\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/pages\/79"}],"collection":[{"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/comments?post=79"}],"version-history":[{"count":36,"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/pages\/79\/revisions"}],"predecessor-version":[{"id":344,"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/pages\/79\/revisions\/344"}],"wp:attachment":[{"href":"https:\/\/www.eecs.yorku.ca\/~mdaminul\/index.php\/wp-json\/wp\/v2\/media?parent=79"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}